Advanced research on vitrification technology by structural analysis using synchrotron radiation and neutrons

Okamoto, Yoshihiro; Nagai, Takayuki

no journal, , 

We have investigated the structure of simulated vitrified waste samples using analytical techniques such as synchrotron radiation XAFS and imaging XAFS, as well as Raman spectroscopy. Since the vitrified waste is a multi-component sample containing 30 or more elements, it is effective to use XAFS excellent in element selectivity. On the other hand, XAFS is a local structure analysis technology, and imaging is an analysis technology on the micron level in resolution. In order to discuss stability of the vitrified waste from the structural information, information on middle and long range structures is necessary. It is necessary to what distance the components contained in the vitrified waste have structural order, how network structure of the glass is changed by containing the waste components, and information on phase separation and aggregation. In addition to the structural analysis that has been carried out so far, we apply wide-angle scattering, PDF analysis, small-angle scattering, and stress-strain analysis to vitrified waste samples in order to obtain these structural information. Synchrotron radiation and neutrons are used for these structural analysis experiments. It is a plan to construct multi-scale structural analysis that can evaluate the soundness of the vitrified waste.